JEOL NeoScope JCM-7000 SEM Elektronmikroskop
JEOL NeoScope JCM-7000 SEM - Image 2
JEOL NeoScope JCM-7000 SEM - Image 3

JEOL NeoScope JCM-7000 SEM

The Jeol JCM-7000 is a compact tabletop scanning electron microscope that can easily handle advanced analytical applications. The instrument complements optical microscopy with its excellent depth of field and high magnification. Useful features include real-time 3D imaging, easy-to-use metrology tools and optional fully integrated EDS for elemental analysis.

Categories: , , ,
JEOL NeoScope JCM-7000 SEM Elektronmikroskop
JEOL NeoScope JCM-7000 SEM - Image 2
JEOL NeoScope JCM-7000 SEM - Image 3

JEOL NeoScope JCM-7000 SEM

The Jeol JCM-7000 is a compact tabletop scanning electron microscope that can easily handle advanced analytical applications. The instrument complements optical microscopy with its excellent depth of field and high magnification. Useful features include real-time 3D imaging, easy-to-use metrology tools and optional fully integrated EDS for elemental analysis.

Categories: , , ,

 

 

Contact the product specialist:

Torgeir Dahlen
torgeir.dahlen@bergmanlabora.se
Tel: 08-625 18 01

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Direct magnification: x10 to 100.00
Display magnification: x24 to 202,168
Mode – High-Vacuum mode: Secondary electron image, Backscattered electron image (composition, topographic and shadow, 3D images)
Mode – Low Vacuum mode: Backscattered electron image (composition, topographic and shadow, 3D images)
Volt acceleration: 5 kV, 10 kV, 15 kV (3 steps)
Electron source: Tungsten filament / Wehnelt Integrated gird
Holder: X-Y motorized table (X: 40 mm Y: 40 mm)
Maximum sample size: 80 mm diameter x 50 mm height
Measurement functions: Between two points, angle, line, width

Links

https://www.nikonmetrology.com/images/brochures/jcm7000-en.pdf

 

 

Contact the product specialist:

Torgeir Dahlen
torgeir.dahlen@bergmanlabora.se
Tel: 08-625 18 01

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Direct magnification: x10 to 100.00
Display magnification: x24 to 202,168
Mode – High-Vacuum mode: Secondary electron image, Backscattered electron image (composition, topographic and shadow, 3D images)
Mode – Low Vacuum mode: Backscattered electron image (composition, topographic and shadow, 3D images)
Volt acceleration: 5 kV, 10 kV, 15 kV (3 steps)
Electron source: Tungsten filament / Wehnelt Integrated gird
Holder: X-Y motorized table (X: 40 mm Y: 40 mm)
Maximum sample size: 80 mm diameter x 50 mm height
Measurement functions: Between two points, angle, line, width

Links

https://www.nikonmetrology.com/images/brochures/jcm7000-en.pdf

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