Electron microscope
Electron microscopes, and in this case scanning electron microscopes (SEMs), use electrons to image very small objects. We provide both scanning electron microscopes, with or without EDS (Energy-dispersive X-ray spectroscopy), and sample preparation equipment from Nikon Metrology and Jeol. The systems are well suited for both academic and industrial research and control.
Need help choosing the right product?
Our product specialists are available to guide you and help you find the right products for your specific requirements. Fill in the form and one of our experts will contact you!
