Nikon Eclipse MA200

The MA200 is Nikon’s most advanced metallurgical microscope. It is an inverted materials microscope with an innovative design optimized for digital imaging and ergonomic efficiency.

Nikon Eclipse MA200

The MA200 is Nikon’s most advanced metallurgical microscope. It is an inverted materials microscope with an innovative design optimized for digital imaging and ergonomic efficiency.

Inverted material microscope with innovative design

The MA200 uses integrated intelligence to automatically combine imaging that automatically relates the image with the data set for easier workflow. It has a new and unique box design that allows you to easily apply the sample to the table, while reducing the footprint to about one third of a conventional system.

Applications:

  • Metallurgy, metalworking
  • Cast iron nodularity and flake analysis, grain size analysis.
  • Surface analysis
  • Antenna and telescope
  • Telecom and electronics
  • Mobile phone

 

Contact the product specialist:

Torgeir Dahlen
torgeir.dahlen@bergmanlabora.se
Tel: 08-625 18 01

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Observation methods: Brightfield, darkfield, polarization, DIC, fluorescence
Revolving lens: 4 different depending on observation technique
Table: 50×50 mm displacement

https://www.nikonmetrology.com/en-gb/industrial-microscopes/inverted-microscopes-eclipse-ma200

Inverted material microscope with innovative design

The MA200 uses integrated intelligence to automatically combine imaging that automatically relates the image with the data set for easier workflow. It has a new and unique box design that allows you to easily apply the sample to the table, while reducing the footprint to about one third of a conventional system.

Applications:

  • Metallurgy, metalworking
  • Cast iron nodularity and flake analysis, grain size analysis.
  • Surface analysis
  • Antenna and telescope
  • Telecom and electronics
  • Mobile phone

 

Contact the product specialist:

Torgeir Dahlen
torgeir.dahlen@bergmanlabora.se
Tel: 08-625 18 01

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Observation methods: Brightfield, darkfield, polarization, DIC, fluorescence
Revolving lens: 4 different depending on observation technique
Table: 50×50 mm displacement

https://www.nikonmetrology.com/en-gb/industrial-microscopes/inverted-microscopes-eclipse-ma200

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