Nikon XT V Series
Nikon’s XT V series consists of world-leading X-ray and CT inspection for electronics (PCB, BGA and chip design) and other components for a wide range of applications.
Nikon XT V Series
Nikon’s XT V series consists of world-leading X-ray and CT inspection for electronics (PCB, BGA and chip design) and other components for a wide range of applications.
World-leading X-ray and CT inspection
The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, the system user controls the 5-axis sample manipulator. Real-time X-ray allows users to intuitively navigate complex circuit boards and electronic components and quickly track defects. In automated inspection mode, samples can be inspected at the highest throughput.
- Market-leading microfocus technology
- Fast automated component control through customizable macros
- Intuitive joystick control shows real-time X-ray images
- Low operating and maintenance costs.
- CT and X.Tract (laminography) ready
Contact the product specialist:
Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40
Technical specification
Type: Open tube with microfocus
Choice of objectives: Reflection objectives
Max energy: 130 kV
Minimum resolution: 1 um
Max weight of sample: 5 kg
Geometric magnification: 2.5-2400x
System magnification: up to 36 000x
CT /X.tract: Optional
Primary applications: real-time electronics inspection, semiconductor inspection and failure analysis
Cabinet length: 1786 mm
Cabinet width: 1200 mm
Cabinet height: 1916 mm
System weight: 1935 kg
World-leading X-ray and CT inspection
The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, the system user controls the 5-axis sample manipulator. Real-time X-ray allows users to intuitively navigate complex circuit boards and electronic components and quickly track defects. In automated inspection mode, samples can be inspected at the highest throughput.
- Market-leading microfocus technology
- Fast automated component control through customizable macros
- Intuitive joystick control shows real-time X-ray images
- Low operating and maintenance costs.
- CT and X.Tract (laminography) ready
Contact the product specialist:
Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40
Technical specification
Type: Open tube with microfocus
Choice of objectives: Reflection objectives
Max energy: 130 kV
Minimum resolution: 1 um
Max weight of sample: 5 kg
Geometric magnification: 2.5-2400x
System magnification: up to 36 000x
CT /X.tract: Optional
Primary applications: real-time electronics inspection, semiconductor inspection and failure analysis
Cabinet length: 1786 mm
Cabinet width: 1200 mm
Cabinet height: 1916 mm
System weight: 1935 kg
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