Nikon MCT225

Absolute precision. Dimensional inspection using industrial CT has many advantages as all internal dimensions can be measured without destroying the sample.

Nikon MCT225

Absolute precision. Dimensional inspection using industrial CT has many advantages as all internal dimensions can be measured without destroying the sample.

Absolute precision

The MCT225 is an absolute precision Metrology-CT (MCT) system that ensures all internal and external geometry is measured efficiently. Proprietary liquid-cooled reflection source with microfocus and an air-cooled cabinet provide long-term stability and enable the MCT225 to achieve impressive accuracy. The system offers superior measurement accuracy and small part detection for inspecting precision plastic parts, small moldings, complex parts and assemblies.

  • 50 years of experience in coordinate measuring machines (CMMs) and 25 years of experience in X-ray computed tomography (CT)
  • Absolute accuracy 9 + L / 50 μm in accordance with VDI / VDE 2630
  • Proprietary microfocus source developed for metrology CT purposes
  • Suitable for a wide range of sample sizes and material densities

 

Contact the product specialist:

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Type: Open tube with microfocus
Choice of objectives: Reflection objectives
Max energy: 225 kV
Minimum resolution: 3 um
Max weight of sample: 50 kg
Cabinet length: 2414 mm
Cabinet width: 1275 mm
Cabinet height: 2202 mm
System weight: 4200 kg

https://www.nikonmetrology.com/en-gb/x-ray-ct/x-ray-ct-systems-225kv-and-320kv-ct-inspection-and-metrology

Absolute precision

The MCT225 is an absolute precision Metrology-CT (MCT) system that ensures all internal and external geometry is measured efficiently. Proprietary liquid-cooled reflection source with microfocus and an air-cooled cabinet provide long-term stability and enable the MCT225 to achieve impressive accuracy. The system offers superior measurement accuracy and small part detection for inspecting precision plastic parts, small moldings, complex parts and assemblies.

  • 50 years of experience in coordinate measuring machines (CMMs) and 25 years of experience in X-ray computed tomography (CT)
  • Absolute accuracy 9 + L / 50 μm in accordance with VDI / VDE 2630
  • Proprietary microfocus source developed for metrology CT purposes
  • Suitable for a wide range of sample sizes and material densities

 

Contact the product specialist:

Johan Sternemalm
johan.sternemalm@bergmanlabora.se
Tel: 031-10 54 40

Technical specification

Type: Open tube with microfocus
Choice of objectives: Reflection objectives
Max energy: 225 kV
Minimum resolution: 3 um
Max weight of sample: 50 kg
Cabinet length: 2414 mm
Cabinet width: 1275 mm
Cabinet height: 2202 mm
System weight: 4200 kg

https://www.nikonmetrology.com/en-gb/x-ray-ct/x-ray-ct-systems-225kv-and-320kv-ct-inspection-and-metrology

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